Calibration Standards | 新皋企業股份有限公司 | Ample Goal - AFM Probes

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Calibration Standards

2D200

Pitch:

200nm

Depth:

70nm

Structure:

inverted pyramids

HS-20MG

Pitch:

5µm / 10µm

Depth:

20 nm

Structure:

Structure Arrays

TipCheck

Function:

Tip Characterization

Feature:

Wear-Resistant Coating

Structure:

Granular Nanostructure

TGXYZ01

Pitch:

5µm / 10µm

Depth:

20 nm

Structure:

Structure Arrays

TGX

Edit-SEM-image-of-the-TGX-surface-structures-20130121110114.jpg

Pitch:

3 µm

Feature:

Edge Radii < 5 nm

Structure:

Square Holes Array

2D300

Pitch:

300nm

Depth:

35nm

Structure:

inverted pyramids

HS-100MG

Pitch:

5µm / 10µm

Depth:

100 nm

Structure:

Structure Arrays

KPFM & EFM Sample

Pitch:

8µm / 20µm / 40µm

Depth:

35 nm

Structure:

Alternating Al & Au Lines

TGXYZ02

Pitch:

5µm / 10µm

Depth:

100 nm

Structure:

Structure Arrays

TGF11

Pitch:

10 µm

Edge Angle:

54.74°

Structure:

1D Trapezoidal Array

CS-20NG

Pitch:

500nm / 5µm / 10µm

Depth:

20nm

Structure:

XYZ Nanogrid

HS-500MG

Pitch:

5µm / 10µm

Depth:

500 nm

Structure:

Structure Arrays

PA01

Function:

Tip Characterization

Feature:

Edge Radii < 5nm

Structure:

Sharp Pyramidal Nanostructures

TGXYZ03

Pitch:

5µm / 10µm

Depth:

500 nm

Structure:

Structure Arrays

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