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TipCheck

Sample for Fast and Convenient AFM Tip Evaluation
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

  • Fast and convenient determination of the AFM tip condition (apex shape and sharpness) without SEM inspection. 

  • Ideal for reversely imaging an AFM probe’s tip apex. 

  • Compatible with Auto Tip Qualification software on the market.

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Structure Specifications

Structure Type
Pitch
Step Height
Accuracy
Edge Radii
Granular nanostructure
N/A
N/A
N/A

Chip Dimensions

Active Area
Chip Dimensions
Material / Coating
N/A
5 × 5 mm
Extremely wear-resistant thin film coating

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