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PA01

AFM tip evaluation sample with sharp pyramidal structures
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

  • Sample for characterization of AFM tip shape with hard sharp pyramidal nanostructures.

  • The structures are covered by a highly wear-resistant layer to ensure durability. 

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Structure Specifications

Structure Type
Pitch
Step Height
Accuracy
Edge Radii
pyramidal nanostructures
N/A
N/A
< 5 nm

Chip Dimensions

Active Area
Chip Dimensions
Material / Coating
5 × 5 mm
5 × 5 × 0.7 mm
Highly wear-resistant layer

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