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CS-20NG

XYZ Calibration Nanogrid with 20nm Step Height and 500nm Period
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

  • Advanced XYZ calibration nanogrid for simultaneous lateral (X, Y) and vertical (Z) AFM scanner calibration.

  • Structure symmetry allows one-step calibration without rotating the sample. 

  • Glued onto a 12mm metal disc using electrically conductive epoxy. (Unmounted version available as CS-20NG-UM)

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Structure Specifications

Structure Type
Pitch
Step Height
Accuracy
Edge Radii
Silicon dioxide structure arrays
10 µm / 5 µm / 500 nm
~20 nm
N/A
N/A

Chip Dimensions

Active Area
Chip Dimensions
Material / Coating
1×1mm / 500×500µm / 100×100µm
5 × 5 mm
Silicon dioxide

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