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2D200

Lateral-(XY)-Calibration Grating available from the NANOSENSORS
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

  • Used for very precise X-Y calibration of the scanning mechanism.

  • Developed in close cooperation with PTB (German national authority of standards).

  • Glued onto a 12mm stainless steel sample holder.

Features a "FindMe" structure surrounding the active area for easy positioning.

Structure Specifications

Structure Type
Pitch
Step Height
Accuracy
Edge Radii
Inverted Pyramids
200 nm
N/A
±0.01%
N/A

Chip Dimensions

Active Area
Chip Dimensions
Material / Coating
100 x 100 µm²
5 x 7 mm²
Silicon

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