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KPFM & EFM Sample

Sample with Al and Au line arrays for KPFM and EFM tests
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針
  • Sample for KPFM and EFM tests featuring arrays with alternating Aluminum (Al) and Gold (Au) lines.

  • Deposited on an oxide-covered silicon substrate.

  • Features large, medium, and small line groups with thin copper wires connected to the Al and Au contact pads.

  • Mounted on a 15 mm glass disc - metal disc stack to isolate electrical signals.

Structure Specifications

Structure Type
Pitch
Step Height
Accuracy
Edge Radii
Alternating Al and Au lines array
8 µm / 20 µm / 40 µm
35 nm
N/A
N/A

Chip Dimensions

Active Area
Chip Dimensions
Material / Coating
4 × 2 mm
5 × 5 × 0.8 mm
Aluminum and Gold

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