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HS-100MG

Height Calibration Standard with 100nm Step Height
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

Affordable high-quality height standard for easy and reliable Z-axis calibration. 

  • Also allows X- and Y-axis calibration for bigger scanners (40-100µm range) without rotating the sample. 

  • Glued onto a 12mm metal disc. (Unmounted version available as HS-20MG-UM)

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Structure Specifications

Structure Type
Pitch
Step Height
Accuracy
Edge Radii
Silicon dioxide structure arrays
10 µm / 5 µm
~100 nm
N/A
N/A

Chip Dimensions

Active Area
Chip Dimensions
Material / Coating
1×1mm / 500×500µm
5 × 5 mm
Silicon dioxide

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