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XNC12/Cr-Au BS

AFM Probe with Gold Coated Silicon Nitride AFM Cantilevers
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

AFM probes of the XNC12 series have 2 silicon nitride AFM cantilevers and AFM tips on a glass holder chip. They are used for soft contact mode applications.

The gold reflective coating enhances the laser reflectivity of the AFM cantilevers.

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AFM Tip

Height
Half Cone Angle
Radius
3.5[µm]
40°
<10 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
CB1: 0.08[N/m]
CB2: 0.32[N/m]
CB1: 17[kHz]
CB2: 67[kHz]
CB1: 200[µm]
CB2: 100[µm]

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