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XNC12/Cr-Au
AFM Probe with Gold Coated Silicon Nitride AFM Cantilevers
AFM probes of the XNC12 series have 2 silicon nitride AFM cantilevers and AFM tips on a glass holder chip. They are used for soft contact mode applications.
The overall gold coating with 20 nm chromium sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers. The coating may cause AFM cantilever bending up to 3°
AFM Tip
Height
Half Cone Angle
Radius
3.5[µm]
40°
<10 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
CB1: 0.08[N/m]
CB2: 0.32[N/m]
CB1: 17[kHz]
CB2: 67[kHz]
CB1: 200[µm]
CB2: 100[µm]
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