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Tap300GD-G

Tapping Mode AFM Probe with Gold Reflective Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

AFM Tip

Height
Half Cone Angle
Radius
15-19 [µm]
axis:20°-25°, side:25°-30°, apex:10°
<10 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
40 [N/m]
300 [kHz]
125 [µm]

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