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SSS-SEIHR

SuperSharpSilicon™ - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

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AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
at 200 nm from apex < 10°
2 nm

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
15 [N/m]
130 [kHz]
225 [µm]

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