The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy AFM probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated AFM tip, a high aspect ratio at the last few hundred nanometers of the AFM tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.

Due to the low magnetic moment of the AFM tip the sensitivity to magnetic forces is decreased if compared to standard MFM probe but the disturbance of soft magnetic samples is also reduced.

The hard magnetic coating on the AFM tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm3 (these values were determined on a flat surface).