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SSS-NCH

SuperSharpSilicon™ - Non-Contact / Tapping Mode - High Resonance Frequency
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

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AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
at 200 nm from apex < 10°
2 nm

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
42 [N/m]
330 [kHz]
125 [µm]

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