The NANOSENSORS™ SSS-MFMR AFM probe is optimized for high resolution magnetic force imaging. The SuperSharpSilicon™ AFM tip basis combined with a very thin hard magnetic coating result in an extremely small radius of the coated AFM tip and a high aspect ratio at the last few hundred nanometers of the AFM tip - the essential demands for high lateral resolution down to 20 nm in ambient conditions.

Due to the low magnetic moment of the AFM tip the sensitivity to magnetic forces is significantly decreased if compared to standard MFM probes but the disturbance of soft magnetic samples is also reduced.

The hard magnetic coating on the AFM tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm3 (these values were determined on a flat surface).