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SiNi

Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

2 silicon nitride AFM cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
silicon nitride wedge AFM tip

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AFM Tip

Height
Half Cone Angle
Radius
10-14 [µm]
35° (macroscopic)
<15 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
Short:0.27[N/m], Long:0.06[N/m]
Short:1:30 [kHz], Long:1:10 [kHz]
Short: 100 [µm], Long:200 [µm]

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