top of page

S-MFMR

Soft Magnetic Coating - Magnetic force microscopy - Reflex coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NanoWorld® Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic AFM tip coating the magnetisation of the AFM tip will easily get reoriented by hard magnetic samples.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
<50 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
2.8 [N/m]
75 [kHz]
225 [µm]

Need a quote or technical advice?

bottom of page