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qp-fast

uniqprobe™ for Soft- , Standard- , Fast Tapping/Dynamic AFM Imaging
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ qp-fast AFM probes with its 3 AFM cantilevers are designed for soft-, standard- and fast- Non-Contact or Tapping Mode AFM imaging (also known as attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability in air and liquid environments.

A metallic layer (Au) is coated on the detector side of the AFM cantilever. The AFM cantilever bending is less than 2⁰.

The NANOSENSORS™ uniqprobe combines the well-known features of the other NANOSENSORS™ AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

AFM Tip

Height
Half Cone Angle
Radius
7[µm]
12°-18° at the apex
<10 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
CB1: 80[N/m]
CB2: 30[N/m]
CB3: 15[N/m]
CB1: 800[kHz]
CB2: 420[kHz]
CB3: 250[kHz]
CB1: 40[µm]
CB2: 60[µm]
CB3: 80[µm]

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