NANOSENSORS™ PtSi-FM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. NANOSENSORS™ PtSi-FM probes are suitable for C-AFM, Tunneling AFM, Scanning Capacitance Microscopy (SCM), Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KFPM).