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PPP-ZEILR

PointProbe® Plus ZEISS Veritekt Microscopes - Contact Mode Low Force Constant - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

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AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
axis:20°, side 25°-30°, apex:10°
<7 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
1.6 [N/m]
27 [kHz]
450 [µm]

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