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PPP-SEIHR

PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIHR AFM probes (Seiko Instruments / high force constant). Compared with the ZEIHR type the force constant is further reduced.

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AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
axis:20°, side 25°-30°, apex:10°
<7 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
15 [N/m]
130 [kHz]
225 [µm]

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