The NANOSENSORS™ PPP-QLC-MFMR AFM probe combines the low disturbance of magnetic samples by a soft magnetic coating with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. Low coercivity and a Q-factor of more than 35,000 enable magnetic force microscopy of soft magnetic samples and high operation stability under UHV conditions. Due to the low coercivity of the AFM tip coating the magnetisation of the AFM tip will easily get reoriented by hard magnetic samples.