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PPP-NCSTAuD

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ PPP-NCSTAuD AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
<10 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
7.4 [N/m]
160 [kHz]
150 [µm]

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