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PPP-NCSTAu
PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating

NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.
AFM Tip
Height
Half Cone Angle
Radius
10-15 [µm]
N/A
<25 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
7.4 [N/m]
160 [kHz]
150 [µm]
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