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PPP-NCLAu

PointProbe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ PPP-NCLAu probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAu is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

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AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
<25 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
48 [N/m]
190 [kHz]
225 [µm]

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