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PPP-LFMR

PointProbe® Plus Lateral Force Microscopy - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

For lateral or friction force microscopy NANOSENSORS™ offers a special type of AFM probe (LFM: lateral force microscopy). This sensor type is optimized for a high sensitivity to lateral or friction forces by an extremely soft, thin AFM cantilever

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AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
axis:20° , side:25°-30° , apex:10°
<7 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
0.2 [N/m]
23 [kHz]
450 [µm]

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