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PPP-FMAuD
PointProbe® Plus Force Modulation Mode - Au coating (Detector side)

NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability
AFM Tip
Height
Half Cone Angle
Radius
10-15 [µm]
N/A
<10 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
2.8 [N/m]
75 [kHz]
225 [µm]
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