top of page
PNP-TRS
Pyrex-Nitride AFM Probe – TRiangular Single AFM Cantilever
NanoWorld® Pyrex-Nitride PNP-TRS probes are designed for various imaging applications in contact or dynamic mode and can also be used for ScanAsyst®** mode in air.
The Pyrex-Nitride TRS probes have a single silicon nitride AFM cantilever with a very low force constant and an integrated oxide sharpened, pyramidal AFM tip with a height of 3.5 µm. The AFM tip is located 4 µm behind the free end of the AFM cantilever. The AFM probe series features a support chip that is made of Pyrex.
AFM Tip
Height
Half Cone Angle
Radius
3.5[µm]
35° (macroscopic)
<10 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
0.32 [N/m]
67 [kHz]
100 [µm]
bottom of page