NanoWorld® Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode.

The Pyrex-Nitride AFM probes have silicon nitride AFM cantilevers with very low force constants and integrated oxide sharpened, pyramidal AFM tips with a height of 3.5 µm. The AFM tip is located 4 µm behind the free end of the AFM cantilever. The AFM probe series features a support chip that is made of Pyrex. The TR series features two different triangular AFM cantilevers.