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NCSTR
Non-contact / Soft Tapping mode Reflex coating

NanoWorld® Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. Thus, AFM tip and sample wear could be significantly decreased.
AFM Tip
Height
Half Cone Angle
Radius
10-15 [µm]
axis:20°-25°, side:25°-30°, apex:10°
8 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
7.4 [N/m]
160 [kHz]
150 [µm]
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