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NCSTR

Non-contact / Soft Tapping mode Reflex coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NanoWorld® Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. Thus, AFM tip and sample wear could be significantly decreased.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
axis:20°-25°, side:25°-30°, apex:10°
8 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
7.4 [N/m]
160 [kHz]
150 [µm]

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