top of page
Multi75Al-G
Force Modulation AFM Probe with Aluminum Reflective Coating

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM).
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
