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HQ:NSC36/Al BS

AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

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AFM Tip

Height
Half Cone Angle
Radius
12-18 [µm]
40°
<8 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
CB1: 1[N/m]
CB2: 2[N/m]
CB3: 0.6[N/m]
CB1: 90[kHz]
CB2: 130[kHz]
CB3: 65[kHz]
CB1: 110[µm]
CB2: 90[µm]
CB3: 130[µm]

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