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HQ:NSC35/Pt

AFM Probe with 3 Different Conductive Soft Tapping Mode AFM Cantilevers
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

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AFM Tip

Height
Half Cone Angle
Radius
12-18 [µm]
40°
<30 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
CB1: 8.9[N/m]
CB2: 16[N/m]
CB3: 5.4[N/m]
CB1: 205[kHz]
CB2: 300[kHz]
CB3: 150[kHz]
CB1: 110[µm]
CB2: 90[µm]
CB3: 130[µm]

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