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HQ:NSC16/Al BS

Tapping Mode AFM Probe with Long AFM Cantilever
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC16/Cr-Au BS with a reflective gold coating.

AFM Tip

Height
Half Cone Angle
Radius
12-18 [µm]
40°
<8 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
45 [N/m]
190 [kHz]
225 [µm]

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