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HQ:NSC15/Al BS

Standard Tapping Mode AFM Probe
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC15/Cr-Au BS with a reflective gold coating.

AFM Tip

Height
Half Cone Angle
Radius
12-18 [µm]
40°
<8 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
40 [N/m]
325 [kHz]
125 [µm]

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