AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The overall platinum coating is electrically conductive and chemically inert. The thickness of the DPER tip side coating is about 15 nm on the flat cantilever surface, resulting in a coated AFM tip radius below 20 nm. The AFM probes can be used for imaging samples with higher resolution in XY directions.