AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The DPE AFM probes have a special structure of conductive layers applied to the tip side of the AFM cantilevers that provides a better signal-to-noise ratio in the AFM scans of electric properties. The coating thickness is increased, which gives more freedom for using the DPE AFM probes in contact electrical modes. The AFM probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The DPE AFM probes can be used in dynamic electric modes when a study of the electric properties of a sample has higher priority.