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HQ:CSC37/Pt

AFM Probe with 3 Different Conductive Contact Mode AFM Cantilevers
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

AFM probes of the HQ:CSC37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

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AFM Tip

Height
Half Cone Angle
Radius
12-18 [µm]
40°
<30 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
CB1: 0.8[N/m]
CB2: 0.3[N/m]
CB3: 0.4[N/m]
CB1: 40[kHz]
CB2: 20[kHz]
CB3: 30[kHz]
CB1: 250[µm]
CB2: 350[µm]
CB3: 300[µm]

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