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HQ:CSC17/Al BS
Contact Mode AFM Probe
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
AFM Tip
Height
Half Cone Angle
Radius
12-18 [µm]
40°
<8 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
0.18 [N/m]
13 [kHz]
450 [µm]
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