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Hi'Res-C19/Cr-Au

High Resolution, Soft Tapping Mode AFM Probe
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.

AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*.

AFM Tip

Height
Half Cone Angle
Radius
12-18 [µm]
n/a
<1 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
0.5 [N/m]
65 [kHz]
125 [µm]

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