NANOSENSORS™ DT-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. The CONT type is optimized for high sensitivity due to a low force constant.

For applications that require hard contact between AFM tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.