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CONTPt

Contact Mode - PtIr5 coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NanoWorld® Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this AFM probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
<25 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
0.2 [N/m]
13 [kHz]
450 [µm]

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