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CONTE-G
Contact Mode AFM Probe with Platinum Overall Coating
Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as scanning capacitance microscopy (SCM).
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
AFM Tip
Height
Half Cone Angle
Radius
15-19 [µm]
axis:20°-25°, side:25°-30°, apex:10°
<25 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
0.2 [N/m]
13 [kHz]
450 [µm]
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