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ContAl-G
Contact Mode AFM Probe with Aluminum Reflective Coating
Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
AFM Tip
Height
Half Cone Angle
Radius
15-19 [µm]
axis:20°-25°, side:25°-30°, apex:10°
<10 [nm]
AFM Cantilever
Force Constant
Resonance Frequency
Length
0.2 [N/m]
13 [kHz]
450 [µm]
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