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CDT-NCLR

Conductive Diamond Coated Tip - Non-Contact/Tapping Mode - Long cantilever - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ CDT-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to the NANOSENSORS™ high frequency non-contact type (NCH). The CDT-NCLR AFM probe is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
100 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
72 [N/m]
210 [kHz]
225 [µm]

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