top of page

CDT-NCLR

Conductive Diamond Coated Tip - Non-Contact/Tapping Mode - Long cantilever - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ CDT-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to the NANOSENSORS™ high frequency non-contact type (NCH). The CDT-NCLR AFM probe is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

​

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
100 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
72 [N/m]
210 [kHz]
225 [µm]

Need a quote or technical advice?

bottom of page