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CDT-CONTR

Conductive Diamond Coated Tip - Contact Mode - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
100 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
0.5 [N/m]
20 [kHz]
450 [µm]

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