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Arrow™ CONTPt

Contact Mode - PtIr5 coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NanoWorld® Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
N/A
<25 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
0.2 [N/m]
14 [kHz]
450 [µm]

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