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AR5-NCLR_NW

High Aspect Ratio (> 5:1) - Non-contact/Tapping™ mode - Long AFM Cantilever - Reflex coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NanoWorld® Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
< 5°
<10 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
48 [N/m]
190 [kHz]
225 [µm]

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