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AR5-NCHR_NW

High Aspect Ratio (> 5:1) - Non-contact/Tapping™ mode - High resonance frequency - Reflex coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

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AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
< 5°
<10 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
42 [N/m]
320 [kHz]
125 [µm]

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