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AIOE

Multipurpose AFM Probe with 4 Different Cantilevers and Platinum Overall Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the ElectriAll-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

AFM Tip

Height
Half Cone Angle
Radius
15-19 [µm]
axis:20°-25°, side:25°-30°, apex:10°
<25 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
CB1: 0.2[N/m]
CB2: 2.7[N/m]
CB3: 7.4[N/m]
CB4: 40[N/m]
CB1: 15[kHz]
CB2: 80[kHz]
CB3: 150[kHz]
CB4: 350[kHz]
CB1: 500[µm]
CB2: 210[µm]
CB3: 150[µm]
CB4: 100[µm]

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