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4XC-GG
Multiple AFM Cantilevers with Overall Au Coating for Various Applications
AFM probes of the 4XC series feature four different AFM cantilevers for various measurement modes, two on each side of the holder chip:
500DC - Contact mode AFM cantilever, 240AC
Soft tapping mode AFM cantilever for imaging soft samples
200AC - Standard tapping mode AFM cantilever
65AC - High resonance frequency AFM cantilever for High speed scanning
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
AFM Tip
Height
Half Cone Angle
Radius
12-16 [µm]
0° front, 35° back, <9° side
< 30 nm
AFM Cantilever
Force Constant
Resonance Frequency
Length
CB1: 0.3[N/m]
CB2: 2.5[N/m]
CB3: 9[N/m]
CB4: 100[N/m]
CB1: 17[kHz]
CB2: 75[kHz]
CB3: 150[kHz]
CB4: 1200[kHz]
CB1: 500[µm]
CB2: 240[µm]
CB3: 175[µm]
CB4: 65[µm]
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